TY  - BOOK
AU  - Keskitalo, Niclas
AU  - ill.
TI  - Irradiation induced defects for lifetime control on silicon
SN  - 9155439993
AV  - PAM QA76.76.K47 No.291 
CY  - Uppsala
KW  - Science and technology
N1  - Includes bibliographical references
ER  -